For more information

Please contact:
Kelley Bradley, Manager
Nanofabrication Facility
3605 Cullen Blvd, Rm 1011
Houston, TX 77204-5062
Phone: 832-842-8822
Email: rkbradley [at] uh [dot] edu
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Equipment—Analysis

Atomic Force Microscope
Veeco Dimensions 3000 Atomic Force Microscope
Veeco
Dimensions 3000
Atomic Force Microscope
The Veeco 3000 uses a sharp probe to trace contours on a surface but instead of taking one profile it raster back and forth over the sample surface creating a topographic map of height vs. x and y position.
Profilometer
Alpha-Step 200 Profilometer
Tencor
Alpha-Step 200
Profilometer
The Alpha-Step 200 creates is used to view profiles of a sample surface. A sharp probe moves in a line along the surface, moving up or down when features on the surface are encountered. It is used to measure trench depth or step heights on a surface.
Ellipsometer
Gaertner Ellipsometer
Gaertner
Ellipsometer
A linearly polarized HeNe laser is used to quickly measure film thickness and its index of refraction.
Leitz Microscope
Leitz Microscope
Leitz/Leika
20448026
Inspection Microscope
Reflected light optical microscope with magnification up to 200x.
Olympus Inspection Microscope
Olympus
BHMJL
Inspection Microscope
Optical microscope with magnification up to 800x.